Spring Test Probes

Spring test probes are essential tools used in the electronics sector for testing printed circuit boards (PCBs) and semiconductor devices. These highly specialised probes provide accurate and reliable links between the test equipment and the device under test (DUT). They work by compressing a spring-loaded plunger against the contact points of the DUT, ensuring a stable and low-resistance electrical connection. The versatility and precision of spring test probes make them ideal for various testing applications, from high-frequency testing to complex environmental conditions. Manufactured from durable materials like beryllium copper, phosphor bronze, or steel, these probes offer longevity and exceptional performance in harsh environments.

Discover Our Selection of Premium Spring Test Probes

• Standard spring probes
• High-frequency probes
• High-current probes
• Micro-probes for delicate circuits

Unique Features

• Spring-loaded design for reliable contact
• High durability and longevity
• Low-resistance connections
• Suitable for high-frequency and high-current testing

Potential Benefits Offered by Spring Test Probes

• Accurate and repeatable test results
• Reduces wear on tested components
• Compatible with a wide range of test environments
• Easy to install and replace

Versatile Uses of Spring Test Probes

• PCB Testing
• Semiconductor Testing
• Telecommunications Equipment
• Automotive Electronics Diagnostics