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IC Test Clips | Nail Head | Headless | Test Clip

New items

923698-I, 3M

Test clips for d.i.l. enclosures A range of test clips for d.i.l. enclosure components, from 8 → 40 pins with a pitch of 2.54mm, with outputs for wire-grips or connectors.

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New items

92369016-I, 3M

Test clips for d.i.l. enclosures A range of test clips for d.i.l. enclosure components, from 8 → 40 pins with a pitch of 2.54mm, with outputs for wire-grips or connectors.

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New items

The Pomona new test clips are designed especially for in-circuit testing on Small Outline Integrated Circuits (SOIC & SOJ). The SOIC Clip test clip assures a positive connection to all chip leads and provides hands-free testing. Upper contacts are .025" sq. pins, spaced at .100". Pins are perfect for sq. pin receptacles, wire-wrap or jumper leads Gold plated lower contacts assure reliable, noise free connections Molded barriers between each contact allow connections to be made on live boards without accidental shorting to adjacent chip leads

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New items

923 690-40, 3M

DIP test clip, Dual-In-Line Test clips for tapping the component contacts for DIL-ICs that have been soldered in Tin-plated contacts Nail head tapping ends allow probe tips to be connected and stop them from slipping off Smooth tapping ends for plugging in connectors Technical specifications Pole IC width (nail head) Pole IC width (smooth) 08 DIL-IC 7.62 mm 08 DIL-IC 7.62 mm 16 DIL-IC 7.62 mm 20 DIL-IC 7.62 mm 28 DIL-IC 15.24 mm 24 DIL-IC 15.24 mm 28 DIL-IC 15.24 mm 40 DIL-IC 15.24 mm

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New items

IC40, 3M

In-Line Test Connectors These connectors provide full access to all lines in a flat Speedbloc® ribbon cable system Insert between main mating system connectors and provide external pin contacts that can be probed individually or connected to another cable assembly Glass filled polyester with nickel silver alloy contacts 0.1in. spacing. Pin length 6.1mm, body depth 16.5mm

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New items

IC 50, 3M

In-Line Test Connectors These connectors provide full access to all lines in a flat Speedbloc® ribbon cable system Insert between main mating system connectors and provide external pin contacts that can be probed individually or connected to another cable assembly Glass filled polyester with nickel silver alloy contacts 0.1in. spacing. Pin length 6.1mm, body depth 16.5mm

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New items

923 690-20, 3M

DIP test clip, Dual-In-Line Test clips for tapping the component contacts for DIL-ICs that have been soldered in Tin-plated contacts Nail head tapping ends allow probe tips to be connected and stop them from slipping off Smooth tapping ends for plugging in connectors Technical specifications Pole IC width (nail head) Pole IC width (smooth) 08 DIL-IC 7.62 mm 08 DIL-IC 7.62 mm 16 DIL-IC 7.62 mm 20 DIL-IC 7.62 mm 28 DIL-IC 15.24 mm 24 DIL-IC 15.24 mm 28 DIL-IC 15.24 mm 40 DIL-IC 15.24 mm

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New items

IC 34, 3M

In-Line Test Connectors These connectors provide full access to all lines in a flat Speedbloc® ribbon cable system Insert between main mating system connectors and provide external pin contacts that can be probed individually or connected to another cable assembly Glass filled polyester with nickel silver alloy contacts 0.1in. spacing. Pin length 6.1mm, body depth 16.5mm

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New items

21083, Testec

Special accessories for sensing heads Description Stock no. Flexible sensing head adapter on 4 mm connector 437-6569 Clamping hook, screw-on 437-6553 Ground spring for HF applications 437-6575 Micro IC clip with lead for attaching to probe tip (red) 437-6014 Micro IC clip with lead for connecting to sensing head earth (yellow) 437-6020 Micro IC clip double set (red, black) 437-6036 Replacement probe tips (double set) 375-4520 Passive Oscilloscope Probes Note All the products in this range are supplied for use with instruments with a permanent earth connection.

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New items

923703-I, 3M

Test clips for d.i.l. enclosures A range of test clips for d.i.l. enclosure components, from 8 → 40 pins with a pitch of 2.54mm, with outputs for wire-grips or connectors.

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New items

92369014-I, 3M

Test clips for d.i.l. enclosures A range of test clips for d.i.l. enclosure components, from 8 → 40 pins with a pitch of 2.54mm, with outputs for wire-grips or connectors.

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New items

LTC 24/3, 3M

IC Test Clips - 3M Professional IC test clips with nickel silver alloy contacts in a high grade thermoplastic moulding Features are wiping action duck bill contacts for optimum electrical reliability, heavy duty spring for firm uniform contact pressure, and an open nose design that permits probe access directly at the Dual-In-Line (DIP) package pins. The contact comb fits between DIP package leads to eliminate electrical shorting hazards The test clips can be used with standard DIP packages up to 14, 16, 20, 24, 28 and 40 pins Body material High Grade Thermoplastic, Gold plating Contact Material Nickel Silver Alloy Operating Temperature -55°C to +165°C Flammability UL 94 V-0 Current rating 2A

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